International Standard
ISO 15932:2013
Microbeam analysis — Analytical electron microscopy — Vocabulary
Reference number
ISO 15932:2013
Edición 1
2013-12
International Standard
Vista previa
ISO 15932:2013
55560
No disponible en español
Publicado (Edición 1, 2013)

ISO 15932:2013

ISO 15932:2013
55560
Idioma
Formato
CHF 129
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Resumen

ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.

Informaciones generales

  •  : Publicado
     : 2013-12
    : Cierre de la revisión [90.60]
  •  : 1
     : 21
  • ISO/TC 202/SC 1
    37.020  01.040.37 
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