Résumé
Establishes a reference system incorporating all calibrated motions of rotation and displacement on the microscope and its accessories so that the measuring procedures are uniform. Particular attention is given to the polarization parameters and measuring accessories.
Informations générales
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État actuel: PubliéeDate de publication: 1996-12Stade: Norme internationale confirmée [90.93]
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Edition: 1Nombre de pages: 6
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Comité technique :ISO/TC 172/SC 5ICS :37.020
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