Ссылочный номер
ISO 29301:2010
© ISO 2024
ISO 29301:2010
Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures
Версия 1
2010-06
В время отменен
Отозвано (Версия 1, 2010)

Тезис

ISO 29301:2010 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. ISO 29301:2010 is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. ISO 29301:2010 also refers to the calibration of a scale bar. ISO 29301:2010 does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM)

Общая информация

  • Текущий статус
     : Отозвано
    Дата публикации
     : 2010-06
    Этап
    : Отмена международного стандарта [95.99]
  • Версия
     : 1
  • Технический комитет :
    ISO/TC 202/SC 3
    ICS :
    37.020 
  • RSS обновления

Жизненный цикл

Появились вопросы?

Ознакомьтесь с FAQ

  2. Интернет-магазин
  3. Каталог стандартов
  4. МКС
  5. 37
  6. 37.020
  7. ISO 29301:2010