International Standard
ISO 6342:2003
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Reference number
ISO 6342:2003
Edition 2
2003-07
© ISO 2024
International Standard
Read sample
Published (Edition 2, 2003)
This standard was last reviewed and confirmed in 2021. Therefore this version remains current.

ISO 6342:2003

Format
Language
CHF 42
Convert Swiss francs (CHF) to your currency

Abstract

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

General information

  • Status
     : Published
    Publication date
     : 2003-07
    Stage
    : International Standard confirmed [90.93]
  • Edition
     : 2
    Number of pages
     : 3
  • Technical Committee :
    ISO/TC 171
    ICS :
    37.080 
  • RSS updates

Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goal

9
Industry, Innovation and Infrastructure

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)

  2. Store
  3. Standards catalogue
  4. ICS
  5. 37
  6. 37.080
  7. ISO 6342:2003