Reference number
ISO/TS 10867:2010
© ISO 2024
Technical Specification
ISO/TS 10867:2010
Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
Edition 1
2010-09
Withdrawn
Withdrawn (Edition 1, 2010)

Abstract

ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.

ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.

The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.

General information

  • Status
     : Withdrawn
    Publication date
     : 2010-09
    Stage
    : Withdrawal of International Standard [95.99]
  • Edition
     : 1
    Number of pages
     : 14
  • Technical Committee :
    ISO/TC 229
    ICS :
    07.120 
  • RSS updates

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